Quantum Data Loggers come in a series of different formats to enable a variety of different types of survey to be carried out at the same time.

VARIATION 1 Just called Quantum CIPS Equipment.
This is the simplest variation of Quantum and is single channel used for conventional CIPS Surveys only.

VARIATION 2 Called Quantum Plus Equipment.

This is the original Quantum Equipment designed by Corrosion Engineers to overcome limitations of existing CIPS Data Loggers available in the Market Place and reduce survey errors.

This variation of Quantum was designed to enable CIPS measurements to be taken at the DCVG pulse rate and also to allow DCVG electrical measurements in digital format. This allows two types data to be collected in a one-pass survey. It is recommended that this equipment be used in conjunction with analogue DCVG equipment to locate coating fault epicentres that are normally the least protected potential locations on a pipeline.

VARIATION 3 Called Quantum Lateral Equipment.

To be able to carry out conventional CIPS and at the same time record the lateral (90 degree) potential, types of measurement popular in areas under German influence in particular, Quantum Lateral was developed. This type of survey is also known as the Intensive method and uses a two channel data logger. Some companies call this type of survey a DCVG Survey, where the lateral potential is measured. It is not and such claims fall under the category of Sham techniques.

VARIATION 4 Called Quantum L Plus Equipment.

Quantum L Plus equipment allows a number of different CIPS variation measurements to be taken at the same time.

a) Conventional CIPS.
b) Conventional CIPS plus potential difference with a trailing half cell .
c) Conventional CIPS plus lateral half cell (Intensive Method).
d) DCVG Epicentre electrical measurements.

VARIATION 5 Called Quantum Static Equipment.

In addition to the above there is another variation that incorporates all the attributes of Quantum L Plus but is packaged for use as a four channel Data Logger for static measurements.